Lee, Jack

Biography:

Jack Lee is a professor and the Cullen Trust for Higher Education Endowed Professor in Engineering in the Department of Electrical and Computer Engineering at The University of Texas at Austin. He received the B.S. and M.S. degrees in electrical engineering from University of California at Los Angeles in 1980 and 1981, respectively; and the Ph.D. degree in electrical engineering from University of California at Berkeley in 1988. From 1981 to 1984, he was a member of technical staff at the TRW Microelectronics Center, California, in the High-Speed Bipolar Device Program. He worked on bipolar circuit design, fabrication and testing. In 1988, he joined the faculty of The University of Texas at Austin. He has published over 300 journal publications and conference proceedings; 1 book and 1 book chapters. He has been awarded two best paper awards, numerous teaching / research awards and several patents. He has supervised and graduated 33 Ph.D. students. Four of his Ph. D. graduates are now professors in other universities and the rest are working in research and development programs in semiconductor industry. Dr. Lee is a fellow of the Institute of Electrical and Electronic Engineers (IEEE) and Distinguished Lecturer for IEEE Electron Devices Society. At The University of Texas at Austin, Dr. Lee continues to teach two undergraduate circuit analysis and design courses, as well as the graduate level course which he developed entitled "Submicron Device Physics and Technologies" (EE396K). This course focuses on the topics of current research on ultra-small high-speed semiconductor devices used in integrated circuits, and is designed for graduate students wishing to pursue research in the microelectronics area. Research Interests: His current research interests include thin dielectric breakdown and reliability, high-K gate dielectrics and gate electrode, alternative channel materials, high-K thin films for semiconductor memory applications, electronic materials, and semiconductor device fabrication processes, characterization and modeling.