Tuesday, October 15, 2013
7:00 PM
NHB 1.720
Free and open to the public

Polarization imaging has emerged over the past three decades as a powerful complementary imaging tool for a range of sensing applications ranging from astronomy to medical imaging to military sensing.  Polarization carries information about the geometric scattering interactions between light and an object, and polarization data provide details about object orientation, surface roughness, and material composition.  For most of the history of imaging polarization, polarimeters have been considered as zero-bandwidth devices using a linear algebraic formalism.  Over the past several years, our group has worked on new descriptions of polarimeters that describe the devices as channeled information systems.  Since optical detectors are essentially polarization-blind, the polarization details of the field are modulated onto the intensity distribution in time, space, wavelength, or some combination of these domains.  This modulation - which could be functional, periodic, random, etc., - creates channels that can then be demodulated to infer the desired polarization details.

This talk will be a two-part talk accessible to both the generalist and those with great interest in polarization.  It will begin with an overview of polarimetry and several applications thereof.  After motivating the collection of polarization data, the talk will shift to these new paradigms to discuss how to design modulation strategies that are tailored and optimized for measuring particular types of scenes.

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J. Scott Tyo

J. Scott Tyo

University of Arizona

J. Scott Tyo directs the Advanced Sensing Lab in the College of Optical Sciences at the University of Arizona. His laboratory investigates all manner of sensing problems ranging from optical polarization to terahertz imaging to radar systems. Over this breadth of areas, one constant in the ASL's research program is that the physics of the electromagnetic wave interaction with the scene and the sensor are always part of the engineering process from the sensor design to the data exploitation. Professor Tyo received the PhD degree in Electrical Engineering from the University of Pennsylvania, then joined the US Air Force Research Laboratory as USAF officer. He left active service in 2001 to join the University of New Mexico, then moved to the UA in 2006. Prof. Tyo is heavily involved in professional activities, and is a fellow the OSA, SPIE, and the IEEE. He has served on the editorial boards of major OSA and IEEE publications, and has helped to organize several conferences, especially on imaging polarimetry.