Radiation-induced Soft errors are major reliability concerns in systems manufactured at nanoscale technology nodes. This is mostly due to increased number of devices per system, as a side effect of Moore¹s law, and increased chance of multiple upsets, resulting in multiple errors, because of smaller geometries. Between the particle strike on the silicon substrate and itseffect as a system failure, there are various levels of error propagation and masking. These factors need to be quantified in details to accurately account for system reliability and also identify the most vulnerable components in the overall hardware-software design stack for cost-effective reliability improvement. In this talk I will discuss a cross-layer approach for softerror modeling and propagation by considering various factors from circuit layout all the way to the software application.
Wednesday, February 20, 2013
Free and open to the public