UT ECE Student Yong-Chan Ban Awarded SPIE Scholarship

Thursday, May 6, 2010 - 12:00pm

UT ECE Student Yong-Chan Ban Awarded SPIE Scholarship

Yong-Chan Ban SPIE Award

UT ECE Student Yong-Chan Ban has been awarded a $3000 Educational Scholarship in Optical Science and Engineering by SPIE. Ban is pursuing his PhD in UT ECE under the supervision of Prof. David Z. Pan. His research focuses on lithography driven design automation, DFM (design for manufacturing) and VLSI design automation. He was a senior engineer at the Semiconductor R&D Center, Samsung Electronics. He received two Best Paper awards at Samsung Group Technical Conferences in 2004 and 2006, and published over 45 papers and 5 patents.

In 2010 SPIE will be awarding $323,000 in scholarships to 137 outstanding students based on their potential for long-range contribution to optics and photonics, or a related discipline. Award-winning applicants were evaluated and approved by the SPIE Scholarship Committee.

SPIE is the international optics and photonics society, founded in 1955 to advance light-based technologies. Serving more than 188,000 constituents from 138 countries, the Society advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth. SPIE annually organizes and sponsors approximately 25 major technical forums, exhibitions, and education programs in North America, Europe, Asia, and the South Pacific.
 

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