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Dr. Abraham Wins Best Paper Award at Major Symposium

Dr. Jacob Abraham and two of his graduate students—Hongjoong Shin and Byoungho Kim—received the Best Paper Award at the 24th IEEE VLSI Test Symposium for a possible solution to loopback testing problems. The paper, Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits, outlines a new approach to testing mixed-signal circuits. Instead of using the traditional time-domain approach, Professor Abraham and his team were able to create a composite loopback response of all the devices being tested, extract characteristic parameters, and use spectral predictors to provide demonstrably more accurate test results.

The IEEE VLSI Test Symposium has been a premier test conference since it's inception in 1982 with international attendance and a rigorous selection process.