Professor Michael Orshansky was the keynote speaker at the16th International On-Line Testing Symposium (IOLTS) held on July 5-7, 2010 in Corfu, Greece.
The title of his talk was "Statistical Design of Digital Circuits: the First Ten Years.” In the talk, Prof. Orshansky discussed the status of statistical design of digital circuits after a decade of intense work in the area. Specifically, he focused on evaluating evidence for the practical adoption of the new techniques and on assessing the limitations of some of the assumptions made in the early years of the discipline.
The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, University of Athens and University of Piraeus.