UT ECE Student Fei Xue and Prof. Jack Lee Win Nicollian Award
UT ECE student Fei Xue and Prof. Jack Lee received the Nicollian Award for best paper in IEEE Semiconductor Interface Specialists Conference SISC 2010. The award was for work on "InAs and In0.7Ga0.3As buried channel MOSFETs with ALD gate dielectrics" with H. Zhao, Y. Chen, Y. Wang, F. Zhou, and J. Lee.
