Prof. David Z. Pan and Alumni Receive Inaugural Best Paper Award from the VLSI Journal "Integration"

Wednesday, May 9, 2018 - 11:30am

Prof. David Z. Pan along with Texas ECE alumni Yibo Lin, Bei Yu, Yi Zou and collaborators Zhuo Li and Charles J. Alpert of Cadence Austin received the inaugural Best Paper Award from the VLSI Journal Integration for their paper “Stitch aware detailed placement for multiple e-beam lithography." The award will be presented at the 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design(SMACD) July 2nd-5th in Prague, Czech Republic.

Integration's aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies

Yibo Lin received his PhD from Texas ECE in May 2018 under the supervision of Prof. David Z. Pan. He will continue on in Texas ECE as a postdoctoral researcher. In his time at Texas ECE he has published 11 journal papers and 15 conference papers.

Bei Yu received his PhD from Texas ECE in August 2014 under the supervision of Prof. Pan. He is currently an assistant professor at Chinese University of Hong Kong.

Yi Zou received his PhD from Texas ECE in 2014 under the supervision of Prof. Ray Chen. He is currently an assistant professor at ShanghaiTech.

Zhuo Li and Chuck Alpert are with Cadence Austin.