Dr. Michael Orshansky, NSF CAREER Award recipient, was named Outstanding New Faculty by the Association for Computing Machinery’s (ACM) interest group on design automation. The award recognizes a “junior faculty member early in her or his academic career who demonstrates outstanding potential as an educator and/or researcher in the field of electronic design automation.” The selection committee weighs research and teaching accomplishments, but especially considers “the impact that the candidate has had on her or his department and on the EDA field during the initial years of their academic appointment.” In the past year, Dr. Orshansky was the program chair of the Austin Conference on Integrated Systems & Circuits and won the IEEE/ACM William J. McCalla ICCAD Best Paper Award at International Conference on Computer-Aided Design ( ICCAD). His paper, "Joint Design-Time and Post-Silicon Minimization of Parametric Yield Loss using Adjustable Robust Optimization" is co-authored with two of his graduate students, Murari Mani and Ashish K. Singh and describes a novel technique for improvement of integrated circuit yield.