Dr. Abraham Wins Best Paper Award at Major Symposium

Thursday, September 13, 2007 - 7:00pm

Dr. Jacob Abraham and two of his graduate students—Hongjoong Shin and Byoungho Kim—received the Best Paper Award at the 24th IEEE VLSI Test Symposium for a possible solution to loopback testing problems. The paper, Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits, outlines a new approach to testing mixed-signal circuits. Instead of using the traditional time-domain approach, Professor Abraham and his team were able to create a composite loopback response of all the devices being tested, extract characteristic parameters, and use spectral predictors to provide demonstrably more accurate test results.

The IEEE VLSI Test Symposium has been a premier test conference since it's inception in 1982 with international attendance and a rigorous selection process.