ECE professor Michael Orshansky has just published a book on the emerging techniques for design for manufacturability. Manufacturability has become a crucial challenge in the design of nanometer scale integrated circuits and systems. The book—co-authored by IBM researcher Dr. Sani Nassif and MIT professor Duane Boning—is entitled Design for Manufacturability and Statistical Design: A Constructive Approach.
The book advances the first comprehensive treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of circuit yield.
Our book can be used as a textbook, but we were also writing it with researchers and working engineers in mind, says Dr. Orshansky.